High Frequency Test
SKU
High Frequency Test
These probe pin products are used for inspecting semiconductors with excellent RF characteristics that can tolerate high-speed devices, and their length has been reduced to 1.6 mm. Various plunger materials are available.
- Easy to modify probe specification (Tip shape, Length, Diameter, Spring Force, Material)
- Supports from small quantity to mass product.
- Supports probe specification evaluation
These probe pin products are used for inspecting semiconductors with excellent RF characteristics that can tolerate high-speed devices, and their length has been reduced to 1.6 mm. Various plunger materials are available.
- Easy to modify probe specification (Tip shape, Length, Diameter, Spring Force, Material)
- Supports from small quantity to mass product.
- Supports probe specification evaluation